Item Infomation
Title: | Machine Learning for High-Risk Applications: Approaches to Responsible AI |
Authors: | Hall, Patrick |
Keywords: | Machine Learning; Artificial Intelligence; Trí tuệ nhân tạo |
Issue Date: | 2023 |
Publisher: | O’Reilly Media, Inc |
Abstract: | This book describes approaches to responsible AI—a holistic framework for improving AI/ML technology, business processes, and cultural competencies that builds on best practices in risk management, cybersecurity, data privacy, and applied social science. Authors Patrick Hall, James Curtis, and Parul Pandey created this guide for data scientists who want to improve real-world AI/ML system outcomes for organizations, consumers, and the public. |
URI: | http://thuvienso.thanglong.edu.vn//handle/TLU/9732 |
Appears in Collections | Tin học |
ABSTRACTS VIEWS
47
VIEWS & DOWNLOAD
0
Files in This Item: